With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
Abstract-- For embedded systems where neither energy nor reliability can be easily sacrificed, we present an energy efficient soft error protection scheme for register files (RF). ...
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...