5 search results - page 1 / 1 » DIATEST: A Fast Diagnostic Test Pattern Generator for Combin... |
ICCAD
1991
IEEE
13 years 9 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ET
2000
13 years 5 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
DFT
2008
IEEE
13 years 12 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
JAIR
2010
13 years 3 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...