67 search results - page 2 / 14 » Defect Aware Test Patterns |
ICPR
2000
IEEE
14 years 6 months ago
2000
IEEE
This paper addresses detection of imperfections in repetitive regular structures (textures). Humans can easily find such defects without prior knowledge of the `good' pattern...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...