424 search results - page 2 / 85 » Delay modelling improvement for low voltage applications |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
A CMOS flash analog-to-digital converter (ADC) designed for high speed and low voltage is presented. Using the Threshold Inverter Quantization (TIQ) comparator technique, a flas...
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
A new high speed low input current comparator is proposed in this paper. Based on a simple negative feedback scheme around the transimpedance stage with an emphasis on a very larg...
ETS
2006
IEEE
13 years 10 months ago
2006
IEEE
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
AIA
2007
13 years 6 months ago
2007
Designers aim at fast but low-power consuming integrated circuits. Since high processing speed always comes with high energy demands, the literature provides several ways to reduc...