The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
Defect and fault tolerance is being studied in a 3D Heterogeneous Sensor using a stacked chip with sensors located on the top plane, and inter-plane vias connecting these to other...
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...
Awareness of the need for robustness in distributed systems increases as distributed systems become integral parts of day-to-day systems. Self-stabilizing while tolerating ongoing ...