98 search results - page 2 / 20 » Design Optimization for Robustness to Single Event Upsets |
AHS
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Conventional error correcting code (ECC) schemes used in memories and caches cannot correct double bit errors caused by a single event upset (SEU). As memory density increases, mu...
FPL
2006
Springer
13 years 8 months ago
2006
Springer
Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...