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» Design and defect tolerance beyond CMOS
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CODES
2008
IEEE
13 years 6 months ago
Design and defect tolerance beyond CMOS
It is well recognized that novel computational models, devices and technologies are needed in order to sustain the remarkable advancement of CMOS-based VLSI circuits and systems. ...
Xiaobo Sharon Hu, Alexander Khitun, Konstantin K. ...
ICCAD
2005
IEEE
123views Hardware» more  ICCAD 2005»
14 years 1 months ago
Hybrid CMOS/nanoelectronic digital circuits: devices, architectures, and design automation
Abstract— Physics offers several active devices with nanometerscale footprint, which can be best used in combination with a CMOS subsystem. Such hybrid circuits offer the potenti...
André DeHon, Konstantin Likharev
FPGA
2006
ACM
141views FPGA» more  FPGA 2006»
13 years 8 months ago
A reconfigurable architecture for hybrid CMOS/Nanodevice circuits
This report describes a preliminary evaluation of possible performance of an FPGA-like architecture for future hybrid "CMOL" circuits which combine a semiconductor-trans...
Dmitri B. Strukov, Konstantin Likharev
DFT
2006
IEEE
77views VLSI» more  DFT 2006»
13 years 10 months ago
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
A Fault Tolerant Active Pixel Sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the life...
Michelle L. La Haye, Cory Jung, David Chen, Glenn ...
DAC
2010
ACM
13 years 3 months ago
An error tolerance scheme for 3D CMOS imagers
A three-dimensional (3D) CMOS imager constructed by stacking a pixel array of backside illuminated sensors, an analog-to-digital converter (ADC) array, and an image signal process...
Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, ...