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ICCD
2008
IEEE
221views Hardware» more  ICCD 2008»
14 years 1 months ago
Reversi: Post-silicon validation system for modern microprocessors
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
Ilya Wagner, Valeria Bertacco
VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
14 years 5 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
13 years 10 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
13 years 9 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra