37 search results - page 1 / 8 » Design of a Robust 8-Bit Microprocessor to Soft Errors |
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
This work presents a fault-tolerant version of the
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
CASES
2006
ACM
13 years 9 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
HPCA
2009
IEEE
14 years 2 days ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...