18 search results - page 2 / 4 » Design of a Single Event Upset (SEU) Mitigation Technique fo... |
DAC
2008
ACM
14 years 6 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
DFT
2007
IEEE
13 years 9 months ago
2007
IEEE
This paper presents the adoption of the Triple Modular Redundancy coupled with the Partial Dynamic Reconfiguration of Field Programmable Gate Arrays to mitigate the effects of Sof...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...