30 search results - page 2 / 6 » Diagnosis of Hold Time Defects |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
DATE
2009
IEEE
14 years 4 days ago
2009
IEEE
In this paper, a novel diagnosis method is proposed. The proposed technique uses machine learning techniques instead of traditional cause-effect and/or effect-cause analysis. The ...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
ATS
2009
IEEE
14 years 6 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [7, 8]. The improve...