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» Diagnosis of Interconnect Faults in Cluster-Based FPGA Archi...
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FPL
2005
Springer
112views Hardware» more  FPL 2005»
13 years 11 months ago
Defect-Tolerant FPGA Switch Block and Connection Block with Fine-Grain Redundancy for Yield Enhancement
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
Anthony J. Yu, Guy G. Lemieux
FPGA
2000
ACM
141views FPGA» more  FPGA 2000»
13 years 9 months ago
Tolerating operational faults in cluster-based FPGAs
In recent years the application space of reconfigurable devices has grown to include many platforms with a strong need for fault tolerance. While these systems frequently contain ...
Vijay Lakamraju, Russell Tessier
DAC
2000
ACM
14 years 7 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2004
ACM
14 years 7 months ago
Efficient on-line testing of FPGAs with provable diagnosabilities
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
Vinay Verma, Shantanu Dutt, Vishal Suthar
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
13 years 11 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...