7 search results - page 1 / 2 » Dynamic Data-bit Memory Built-In Self- Repair |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
CSREAESA
2009
13 years 5 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
ATS
2003
IEEE
13 years 8 months ago
2003
IEEE
We propose an embedded processor-based built-in self-repair (BISR) design for embedded memories. In the proposed design we reuse the embedded processor that can be found on almost...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...