41 search results - page 7 / 9 » Dynamic fault collapsing and diagnostic test pattern generat... |
FPL
2004
Springer
13 years 11 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
ATS
2009
IEEE
14 years 17 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ICCAD
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
INTEGRATION
2006
13 years 5 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
JAIR
2010
13 years 4 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...