45 search results - page 2 / 9 » Efficient Embedding of Deterministic Test Data |
DAC
2003
ACM
13 years 10 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test ...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 6 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
TC
2002
13 years 4 months ago
2002