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ICCD
2004
IEEE

Compressed Embedded Diagnosis of Logic Cores

11 years 1 months ago
Compressed Embedded Diagnosis of Logic Cores
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed.
Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2004
Where ICCD
Authors Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici
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