71 search results - page 3 / 15 » Efficient probe selection algorithms for fault diagnosis |
ASPDAC
2001
ACM
13 years 9 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
TSMC
2008
13 years 5 months ago
2008
An algorithm is developed for computing which sensors to add to obtain maximum fault detectability and fault isolability. The method is based on only the structural information in...
CSB
2003
IEEE
13 years 10 months ago
2003
IEEE
The oligo microarray (DNA chip) technology in recent years has a significant impact on genomic study. Many fields such as gene discovery, drug discovery, toxicological research ...
INFOCOM
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract – In this paper, we develop failure-resilient techniques for monitoring link delays and faults in a Service Provider or Enterprise IP network. Our two-phased approach at...