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MTV
2005
IEEE
101views Hardware» more  MTV 2005»
13 years 10 months ago
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...
ATS
2001
IEEE
172views Hardware» more  ATS 2001»
13 years 9 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
13 years 10 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
13 years 10 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
ISCAS
2008
IEEE
133views Hardware» more  ISCAS 2008»
13 years 11 months ago
A hybrid self-testing methodology of processor cores
—Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new ho...
Tai-Hua Lu, Chung-Ho Chen, Kuen-Jong Lee