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» Error Analysis of Camera Parameter Estimation based on Colli...
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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 9 days ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
KDD
2007
ACM
160views Data Mining» more  KDD 2007»
14 years 6 months ago
Show me the money!: deriving the pricing power of product features by mining consumer reviews
The increasing pervasiveness of the Internet has dramatically changed the way that consumers shop for goods. Consumergenerated product reviews have become a valuable source of inf...
Nikolay Archak, Anindya Ghose, Panagiotis G. Ipeir...
CRV
2011
IEEE
305views Robotics» more  CRV 2011»
12 years 5 months ago
Motion Segmentation by Learning Homography Matrices from Motor Signals
—Motion information is an important cue for a robot to separate foreground moving objects from the static background world. Based on the observation that the motion of the backgr...
Changhai Xu, Jingen Liu, Benjamin Kuipers
DPHOTO
2009
138views Hardware» more  DPHOTO 2009»
13 years 3 months ago
Statistical identification and analysis of defect development in digital imagers
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
Jenny Leung, Glenn H. Chapman, Zahava Koren, Israe...
IPMI
2005
Springer
13 years 11 months ago
Fundamental Limits in 3D Landmark Localization
This work analyses the accuracy of estimating the location of 3D landmarks and characteristic image structures. Based on nonlinear estimation theory we study the minimal stochastic...
Karl Rohr