8 search results - page 1 / 2 » Fast Algorithms for Static Compaction of Sequential Circuit ... |
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
ICCAD
1999
IEEE
13 years 9 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...