20 search results - page 2 / 4 » Fast Method to Include Parasitic Coupling in Circuit Simulat... |
3DIC
2009
IEEE
14 years 21 hour ago
2009
IEEE
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This paper presents a general method for computing transient sensitivities using the adjoint method in event driven simulation algorithms that employ piecewise linear device model...
VLSID
2000
IEEE
13 years 9 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
TCAD
2010
12 years 12 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
CCECE
2006
IEEE
13 years 11 months ago
2006
IEEE
Integrated Q-enhanced RF LC filters using negative resistances implemented using cross coupled pairs frequently suffer from poor linearity performance. Several linearization met...