32 search results - page 3 / 7 » Fast Sequential Circuit Test Generation Using High-Level and... |
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICCAD
1996
IEEE
13 years 10 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
DAC
1994
ACM
13 years 10 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
ICCAD
1997
IEEE
13 years 10 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
TCAD
1998
13 years 5 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...