Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
In this paper we propose a fault-tolerant processor architecture and an associated fault-tolerant computation model capable of fault tolerance in the nanoelectronic environment th...
The structural redundancy inherent to on-chip interconnection networks [networks on chip (NoC)] can be exploited by adaptive routing algorithms in order to provide connectivity eve...
Abstract. A fault tolerant parallel virtual file system is designed and implemented to provide high I/O performance and high reliability. A queuing model is used to analyze in deta...