172 search results - page 2 / 35 » FinFET-based SRAM design |
JCP
2008
13 years 5 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
ETS
2010
IEEE
13 years 3 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
ISLPED
2010
ACM
13 years 5 months ago
2010
ACM
The on-chip memory is a dominant source of power and energy consumption in modern and future processors. This paper explores the use of a new emerging non-volatile memory technolo...
ISQED
2010
IEEE
13 years 7 months ago
2010
IEEE
A new SRAM design is proposed. Body biasing improves the static noise margin (SNM) improved by at least 15% compared to the standard cells. Through using this technique, lowering ...