32 search results - page 3 / 7 » Fsimac: a fault simulator for asynchronous sequential circui... |
VLSID
1997
IEEE
13 years 10 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DFT
2007
IEEE
14 years 19 days ago
2007
IEEE
The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) ...
ICCAD
1997
IEEE
13 years 10 months ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
ASYNC
2000
IEEE
13 years 10 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
DAC
1998
ACM
14 years 7 months ago
1998
ACM