Sciweavers

2 search results - page 1 / 1

» GECOM: Test data compression combined with all unknown respo...

9

ASPDAC
2008
ACM

115views Hardware» more ASPDAC 2008»

GECOM: Test data compression combined with all unknown response masking

13 years 6 months ago

GECOM: Test data compression combined with all unknown response masking

Download www.cecs.uci.edu

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...

claim paper

Read More »

11

DAC
2005
ACM

155views Computer Architecture» more DAC 2005»

Response compaction with any number of unknowns using a new LFSR architecture

13 years 6 months ago

Response compaction with any number of unknowns using a new LFSR architecture

Download www.cecs.uci.edu

This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...

Erik H. Volkerink, Subhasish Mitra

claim paper

Read More »

« Prev « First page 1 / 1 Last » Next »