GECOM: Test data compression combined with all unknown response masking

13 years 6 months ago

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu

ASPDAC 2008 | GECOM Architecture | GECOM ATPG | GECOM Technology | Hardware |

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Added	12 Oct 2010
Updated	12 Oct 2010
Type	Conference
Year	2008
Where	ASPDAC
Authors	Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

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