This paper is about gate sizing under a statistical delay model. It shows we can solve the gate sizing problem exactly for a given statistical delay model. The formulation used al...
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
Matthew R. Guthaus, Natesan Venkateswaran, Chandu ...
This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exc...
Matthew R. Guthaus, Natesan Venkateswaran, Vladimi...
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
We propose a gate resizing method for delay and power optimization that is based on statistical static timing analysis. Our method focuses on the component of timing uncertainties...