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GLVLSI
2005
IEEE

Optimization objectives and models of variation for statistical gate sizing

9 years 5 months ago
Optimization objectives and models of variation for statistical gate sizing
This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exclusively on the optimization algorithms without considering the effects of the variation models and objective functions. This work empirically derives a simple variation model that is then used to optimize for robustness. Optimal results from example circuits used to study the effect of the statistical objective function on parametric yield. Categories and Subject Descriptors J.6 [Computer-Aided Engineering]: Computer-Aided Design General Terms Algorithms, Design. Keywords Robust design, parametric yield optimization.
Matthew R. Guthaus, Natesan Venkateswaran, Vladimi
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where GLVLSI
Authors Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown
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