22 search results - page 3 / 5 » Generation of Test Patterns for Differential Diagnosis of Di... |
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
JAIR
2010
13 years 4 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
ATS
2009
IEEE
14 years 18 days ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
DAC
2000
ACM
14 years 6 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...