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ATS
2000
IEEE
86views Hardware» more  ATS 2000»
13 years 10 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
APSEC
1999
IEEE
13 years 10 months ago
A Source Code Generation Support System Using Design Pattern Documents Based on SGML
Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida