74 search results - page 3 / 15 » Impact of Errors in Operational Spreadsheets |
TVLSI
2010
12 years 11 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
OSDI
2008
ACM
14 years 5 months ago
2008
ACM
The increasing use of computers for saving valuable data imposes stringent reliability constraints on storage systems. Reliability improvement via use of redundancy is a common pr...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
We have developed Argus, a novel approach for providing low-cost, comprehensive error detection for simple cores. The key to Argus is that the operation of a von Neumann core cons...
USENIX
2007
13 years 7 months ago
2007
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
HPCA
2009
IEEE
13 years 11 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...