The industrial world is currently considering the adoption of Wireless Sensor Networks (WSN) for industrial process and control applications. However, when using wireless sensor n...
Carlo Alberto Boano, James Brown, Nicolas Tsiftes,...
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
Sudeep Pasricha, Young-Hwan Park, Fadi J. Kurdahi,...
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...