With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
In this study, we investigate different cache fault tolerance techniques to determine which will be most effective when on-chip memory cell defect probabilities exceed those of cu...
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
Feng Wang 0004, Yuan Xie, Kerry Bernstein, Yan Luo