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» Improving architecture testability with patterns
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ASPDAC
2005
ACM
142views Hardware» more  ASPDAC 2005»
13 years 8 months ago
Bridging fault testability of BDD circuits
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
Junhao Shi, Görschwin Fey, Rolf Drechsler
ATS
2005
IEEE
139views Hardware» more  ATS 2005»
13 years 11 months ago
Shannon Expansion Based Supply-Gated Logic for Improved Power and Testability
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
Swaroop Ghosh, Swarup Bhunia, Kaushik Roy
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 6 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
GLVLSI
2010
IEEE
178views VLSI» more  GLVLSI 2010»
13 years 11 months ago
Improving the testability and reliability of sequential circuits with invariant logic
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris...
METRICS
2002
IEEE
13 years 11 months ago
Testability Analysis of a UML Class Diagram
Design-for-testability is a very important issue in software engineering. It becomes crucial in the case of OO designs where control flows are generally not hierarchical, but are d...
Benoit Baudry, Yves Le Traon, Gerson Sunyé