11 search results - page 1 / 3 » In-System Silicon Validation and Debug |
DT
2008
13 years 4 months ago
2008
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Trace buffers are commonly used to capture data during in-system silicon debug. This paper exploits the fact that it is not necessary to capture error-free data in the trace buffe...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
ASPDAC
2010
ACM
13 years 2 months ago
2010
ACM
It is increasingly difficult to guarantee the first silicon success for complex integrated circuit (IC) designs. Post-silicon validation has thus become an essential step in the I...
ASPDAC
2010
ACM
13 years 2 months ago
2010
ACM
Escaped errors in released silicon are growing in number due to the increasing complexity of modern processor designs and shrinking production schedules. Worsening the problem are ...