8 search results - page 1 / 2 » Interconnect testing in cluster-based FPGA architectures |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
— Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) because faults can be avoided by reconfiguration at almost no real cost. Cl...
TCAD
2002
13 years 4 months ago
2002
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
ET
2006
13 years 4 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...
DAC
2000
ACM
14 years 5 months ago
2000
ACM
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...