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DATE
2008
IEEE
109views Hardware» more  DATE 2008»
14 years 5 months ago
Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad...
ETS
2006
IEEE
110views Hardware» more  ETS 2006»
14 years 4 months ago
Deterministic Logic BIST for Transition Fault Testing
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Valentin Gherman, Hans-Joachim Wunderlich, Jü...
VTS
2007
IEEE
129views Hardware» more  VTS 2007»
14 years 5 months ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DATE
2007
IEEE
83views Hardware» more  DATE 2007»
14 years 5 months ago
High-level test synthesis for delay fault testability
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
Sying-Jyan Wang, Tung-Hua Yeh
DAC
2006
ACM
14 years 11 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram