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» Locating and detecting arrays for interaction faults
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JCO
2008
85views more  JCO 2008»
10 years 1 months ago
Locating and detecting arrays for interaction faults
The identification of interaction faults in component-based systems has focussed on indicating the presence of faults, rather than their location and magnitude. While this is a va...
Charles J. Colbourn, Daniel W. McClary
ACST
2006
10 years 2 months ago
A combinatorial group testing method for FPGA fault location
Adaptive fault isolation methods based on discrepancyenabled pairwise comparisons are developed for reconfigurable logic devices. By observing the discrepancy characteristics of m...
Carthik A. Sharma, Ronald F. DeMara
SIGSOFT
2007
ACM
11 years 1 months ago
Towards incremental adaptive covering arrays
The increasing complexity of configurable software systems creates a need for more intelligent sampling mechanisms to detect and locate failure-inducing dependencies between confi...
Adam A. Porter, Myra B. Cohen, Sandro Fouché...
DFT
2005
IEEE
178views VLSI» more  DFT 2005»
10 years 6 months ago
Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems
Defect and fault tolerance is being studied in a 3D Heterogeneous Sensor using a stacked chip with sensors located on the top plane, and inter-plane vias connecting these to other...
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
ET
2007
119views more  ET 2007»
10 years 1 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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