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» Measuring and Improving Design Patterns Testability
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METRICS
2003
IEEE
13 years 9 months ago
Measuring and Improving Design Patterns Testability
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
Benoit Baudry, Yves Le Traon, Gerson Sunyé,...
EURODAC
1994
IEEE
145views VHDL» more  EURODAC 1994»
13 years 8 months ago
Testability analysis and improvement from VHDL behavioral specifications
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
ICCAD
1998
IEEE
71views Hardware» more  ICCAD 1998»
13 years 8 months ago
High-level variable selection for partial-scan implementation
In this paper, we propose a high-level variable selection for partial-scan approach to improve the testability of digital systems. The testability of a design is evaluated at the ...
Frank F. Hsu, Janak H. Patel
ATS
2005
IEEE
139views Hardware» more  ATS 2005»
13 years 9 months ago
Shannon Expansion Based Supply-Gated Logic for Improved Power and Testability
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
Swaroop Ghosh, Swarup Bhunia, Kaushik Roy
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 4 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...