4 search results - page 1 / 1 » Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Ana... |
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
CSE
2009
IEEE
13 years 11 months ago
2009
IEEE
— To counteract current trends in network malware, distributed solutions have been developed that harness the power of collaborative end-host sensors. While these systems greatly...