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» On Programmable Memory Built-In Self Test Architectures
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CATA
2009
13 years 5 months ago
Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
VLSID
2001
IEEE
93views VLSI» more  VLSID 2001»
14 years 5 months ago
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
CSREAESA
2006
13 years 6 months ago
Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs
Abstract
Daniel T. Milton, Sachin Dhingra, Charles E. Strou...
VTS
2005
IEEE
101views Hardware» more  VTS 2005»
13 years 10 months ago
On-Chip Spectrum Analyzer for Analog Built-In Self Test
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds