9 search results - page 2 / 2 » On Scan Chain Diagnosis for Intermittent Faults |
TODAES
2008
13 years 5 months ago
2008
DATE
2009
IEEE
14 years 2 days ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...