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» On Structural vs. Functional Testing for Delay Faults
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TASE
2010
IEEE
13 years 20 days ago
Intelligent Component-Based Automation of Baggage Handling Systems With IEC 61499
Airport Baggage Handling is a field of automation systems that is currently dependent on centralised control systems and conventional automation programming techniques. In this and...
Geoff Black, Valeriy Vyatkin
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
14 years 7 days ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
13 years 11 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
ISCA
2010
IEEE
336views Hardware» more  ISCA 2010»
13 years 10 months ago
Reducing cache power with low-cost, multi-bit error-correcting codes
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...
Chris Wilkerson, Alaa R. Alameldeen, Zeshan Chisht...
EURODAC
1994
IEEE
145views VHDL» more  EURODAC 1994»
13 years 10 months ago
Testability analysis and improvement from VHDL behavioral specifications
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng