In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
This paper proposes a comprehensive model for test planning in a core-based environment. The main contribution of this work is the use of several types of TAMs and the considerati...
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...