8 search results - page 1 / 2 » On capture power-aware test data compression for scan-based ... |
ET
2002
13 years 4 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...