34 search results - page 1 / 7 » On test conditions for the detection of open defects |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ET
2007
13 years 4 months ago
2007
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...