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» On test coverage of path delay faults
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ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 9 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
DAC
1995
ACM
13 years 8 months ago
The Validity of Retiming Sequential Circuits
Retiming has been proposed as an optimizationstep forsequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so chang...
Vigyan Singhal, Carl Pixley, Richard L. Rudell, Ro...
ISLPED
2006
ACM
129views Hardware» more  ISLPED 2006»
13 years 11 months ago
Variation-driven device sizing for minimum energy sub-threshold circuits
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
Joyce Kwong, Anantha P. Chandrakasan
EAAI
2007
103views more  EAAI 2007»
13 years 5 months ago
Particle swarm-based optimal partitioning algorithm for combinational CMOS circuits
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
Ganesh K. Venayagamoorthy, Scott C. Smith, Gaurav ...
ISCC
2009
IEEE
198views Communications» more  ISCC 2009»
14 years 3 hour ago
An analysis of the heterogeneity and IP packet reordering over multiple wireless networks
Abstract—With the increasing deployment of wireless technologies, such as WLAN, HSDPA, and WiMAX, it is often the case that simultaneous coverage of several access networks is av...
Dominik Kaspar, Kristian Evensen, Audun Fosselie H...