96 search results - page 3 / 20 » On test coverage of path delay faults |
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...