35 search results - page 1 / 7 » On the Maximum Tolerable Noise for Reliable Computation by F... |
TIT
1998
13 years 4 months ago
1998
CF
2004
ACM
13 years 10 months ago
2004
ACM
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...
DAC
2000
ACM
13 years 9 months ago
2000
ACM
This paper develops the noise-counterparts to familiar delay formulas like Elmore or PRIMO. By matching the first few moments of the network’s transfer impedance, we obtain effi...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...